Recherche
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2014
Journal article
An investigation of weighted and degraded silk by complementary microscopy techniques
A number of silk samples, comprising historic materials and modern surrogates, were examined by light, electron and atomic force microscopy, to determine the extent to which such assessments would allow the nature and condition of the materials to be determined. The integrity of these materials had previously been investigated using...Garside, Paul ; Mills, Graham A. ; Smith, James R. ; Wyeth, Paul
silk, textiles, microscopy, atomic force microscopy, conservation, and scanning electron microscopy